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Author:Takashi Ishida

Publications
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jiang-Lin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama and Haruo Kobayashi
EasyChair Preprint 6413

Keyphrases

ADC testing, FFT, flat-top window, Incoherent sampling, SINAD.

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